Structural  and  electrical  properties  of  In35Sb45Se20−xTexchalcogenide thin  films
The structural and electrical properties of the as-prepared and annealed In45Sb35Se20−xTex thin films with different compositions (x = 2.5, 5, 7.5, 10, 12.5 and 15 at.%) prepared by electron beam evaporation method are studied. The XRD patterns of the as-prepared thin film show that the investigated compositions have amorphous and polycrystalline structure depending on the Te content. After annealing the ... إقراء المزيد