This work presents the structural and optical features of magnetron Co-sputtered Al–ZnO thin films. The structure of the films have been carried out using by X-ray diffraction (XRD), scan electron microscope (SEM) and X-ray fluorescence (XRF). The optical constants of the thin films have been depicted in the wavelength range 300–2500 nm using spectrophotometric measurements. The optical band gap of the as-prepared films increases with increasing the content of aluminum. The refractive index as well as the optical conductivity varies with content of aluminum too.