Indium tin oxide (ITO) thin films were prepared by electron beam evaporation at different substrate temperatures. The structural studies were carried out by X-ray diffraction. Optical properties of the films were studied in the ultraviolet-visible-near infrared (UV-Vis-NIR) region (200 to 2500 nm). Electrical studies were carried out at room temperature of ITO films. The results showed that with increase in ...
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