Physical properties of thermally evaporated silicon films nitrided at different rf plasma-processing time
Nitrided surfaces and composition gradients in thin films exhibit interesting mechanical, electrical, and optical properties. Therefore, amorphous hydrogen-free silicon (a-Si) thin films were deposited by electron beam evaporation and subsequently nitrided by an inductively coupled rf plasma. The effects of successive plasma-processing cyclic time on structural and optical properties as well as electrical resistivity were examined by different characterization techniques. ... Read more