a.adam

Alaa Mohamed Adam

Lecturer - مدرس

Faculty of science

Address: المراغة - سوهاج

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Publications Which contain the keyword: electron beam

Characterization of ITO/CdO/glass thin films evaporated by electron beam technique

2018-09-02 22:05:41 Keywords Thin films, ITO, CdO, buffer layer, electron beam, optoelectronic properties,
Characterization of ITO/CdO/glass thin films evaporated by electron beam technique
A thin buffer layer of cadmium oxide (CdO) was used to enhance the optical and electrical properties of indium tin oxide (ITO) films prepared by an electron-beam evaporation technique. The effects of the thickness and heat treatment of the CdO layer on the structural, optical and electrical properties of ITO films were carried out. It was found that the CdO ... Read more

Enhancement of the optical and electrical properties of ITO thin films deposited by electron beam evaporation technique

2018-09-02 22:27:35 Keywords ITO thin films, electron beam, optical properties, electrical properties, Structural properties,
Enhancement of the optical and electrical properties of ITO thin films deposited by electron beam evaporation technique
Indium tin oxide (ITO) is widely utilized in numerous industrial applications due to its unique combined properties of transparency to visible light and electrical conductivity. ITO films were deposited on glass substrates by an electron beam evaporation technique at room temperature from bulk samples, with different thicknesses. The film with 1500 ˚A thick was selected to perform annealing in the ... Read more

Effect of annealing and In content on the properties of electron beam evaporated ZnO films

2018-09-02 22:32:41 Keywords ZnO:In thin films, electron beam, optical properties, Structural properties, electrical properties,
Effect of annealing and In content on the properties of electron beam evaporated ZnO films
The effect of both annealing and In content on the properties of ZnO films prepared by electron beam evaporation were investigated. The evaporation was carried out at room temperature from bulk samples prepared by sintering technique. X-ray diffraction showed that the structure of ZnO-In2O3 films depends on both the In content and annealing temperature. Amorphous, highly transparent and relatively low ... Read more

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